Keithley Instruments, Inc., a world leader in
advanced electrical test instruments and systems, has
announced enhancements to its Automated Characterization Suite (ACS) software
that support its expanding family of high power semiconductor characterization
solutions. The ACS package is optimized for automated wafer-level parameter
test applications, including automated characterization, reliability analysis,
and known good die testing. The ACS V5.0 update specifically leverages the high
power capabilities of Keithley’s Model 2651A (high current) and Model 2657A
(high voltage) System SourceMeter® SMU instruments to enable automated
wafer-level testing of high power semiconductor devices like power MOSFETs,
IGBTs, BJTs, diodes, etc. To learn more, visit www.keithley.com/products/semiconductor/characterizationsoftware.
Keithley has incorporated a variety of
enhancements into ACS V5.0:
·
High power device libraries designed
for use with the Models 2651A (up to 50A or 100A when connecting two units) and
2657A (up to 3,000V) System SourceMeter SMU instruments that support testing
multi-terminal power components in conjunction with lower power Series 2600B
SourceMeter SMU instruments or the Model 4200-SCS Parameter Analyzer to speed
and simplify creating modules and sequences for testing power semiconductor
devices like power MOSFETs, IGBTs, BJTs, diodes, etc.
·
Support for hardware scan, recognition,
and configuration management of the high power Models 2651A and 2657A so users
can quickly connect these instruments to a PC, confirm connectivity, and begin
testing.
·
Support for Series 2600 SMU instruments
equipped with the TSP-Link® inter-unit communication bus, leveraging the
on-board test script processor (TSP®) technology for a multi-processor
environment that provides high parallel throughput while speeding and
simplifying test project development.
·
Sample projects for tests such as high
voltage wafer level reliability (WLR) that build on the wide range of low power
reliability test capabilities provided in earlier ACS releases, providing users
with an excellent starting point for creating or modifying new tests quickly.
·
Support for the ±200V C-V capability of
the Model 4200-CVU-PWR C-V Power Package option for the Model 4200-SCS
Parameter Analyzer to provide a broad range of I-V and C-V measurement
capability for full characterization of semiconductor power components.
ACS Background
ACS combines multiple instruments into
a unified test environment optimized for flexibility, speed, and productivity
in testing and analysis. Its intuitive GUI simplifies configuring test
instrumentation, setting measurement parameters, making I-V measurements, and displaying
results. Users can go from creating a new test setup to characterizing new
devices in a fraction of the time required by older test development
approaches. Just as important, ACS provides all the tools needed to set up
tests, analyze data, and export results - without ever leaving the ACS
environment. ACS is designed for testing with semi and fully automatic probers;
Keithley also offers ACS Basic Edition software for performing semiconductor
device characterization with manual probers or test fixtures.
Availability
ACS V5.0 is available with a number of
Keithley characterization instrument and system configurations. Users of
earlier versions should contact their representative for assistance regarding
ACS upgrades.
For More Information
Visit www.keithley.com/products/semiconductor/characterizationsoftware or
contact the company.
About Keithley Instruments, Inc.
With more than 60 years of measurement
expertise, Keithley Instruments has become a world leader in advanced
electrical test instruments and systems. Their customers are scientists and
engineers in the worldwide electronics industry involved with advanced
materials research, semiconductor device development and fabrication, and the
production of end products such as portable wireless devices. The value Keithley Instruments provide them is a combination of products for their critical measurement needs
and a rich understanding of their applications to improve the quality of their
products and reduce their cost of test. In 2010, Keithley Instruments joined
Tektronix as part of its test and measurement portfolio.