The HD DPS enables higher throughput by delivering more channels and
higher throughput for DC measurements. Available in 24- and 48-channel
instrument form factors to enable configuration flexibility, each DPS channel
can provide up to 1A per channel and up to 24 channels can be merged to deliver
24A to the device under test to address higher current requirements typically
encountered during production test for many emerging SOC devices.
"The HD DPS offers our diverse set of 150+ unique customers an easy
path to upgrade over 3800 J750 systems in the field with more DPS channels to
increase the site count and throughput to reduce the cost of production test,”
said Kyle Klatka, Consumer Digital Marketing manager, Teradyne. "Teradyne
continues to extend instrument performance and density for the J750 and IP750
systems to address emerging technical requirements while delivering
best-in-class cost of test economics for consumer digital devices."
Since its introduction in 1998, Teradyne’s J750 and IP750 test systems
have achieved broad market acceptance as a highly cost effective ATE delivering
test coverage for the broadest set of diverse microcontroller, FPGA and digital
audio/baseband devices with 3,800 system shipments to date. The J750 is widely
available at more than 50 OSAT locations, and Teradyne offers a complete set of
production interface solutions for wafer sort and final test.
About Teradyne
Teradyne (NYSE:TER)
is a leading supplier of Automatic Test Equipment used to test semiconductors,
wireless products, data storage and complex electronic systems which serve
consumer, communications, industrial and government customers. In 2011,
Teradyne had sales of $1.4 billion and employs approximately 3,450 people
worldwide. For more information, visit www.teradyne.com.
Teradyne(R) is a registered trademark of Teradyne, Inc. in the U.S. and other
countries.