February 2, 2012

T&M World Announces Winners of 2012 Best in Test Awards



T&M World has just presented the annual Best in Test awards during 2012 DesignCon show. CONGRATULATIONS to all the deserving winners! Keep up the innovation and as Patrick Mannion of T&M World aptly said during the event, "If it weren't for your perseverence and diligence, none of the technology we now take for granted would have made it past the prototyping board." 


The winners of the 2012 Best in Test awards are:

  • ATE/Production Test: RFEM, Aeroflex
  • Bus and Logic Analyzers: Beagle USB 5000 SuperSpeed Protocol Analyzer, Total Phase
  • Data Acquisition: USB-2408 Series, Measurement Computing
  • Design for Test/Boundary Scan: SFX-TAP16/G, GOEPEL electronic
  • Embedded Test: TR5001T Tiny ICT, Test Research
  • Functional Test: TOSCA Testsuite, TRICENTIS Technology & Consulting
  • LTE Test: VR5 HD Spatial Channel Emulator, Spirent Communications
  • Machine Vision/Inspection: TR7600 SII Automated X-Ray Inspection System, Test Research
  • Multimeters: iDVM iPhone and iPad Enabled Wireless Multimeter, Redfish Instruments
  • Optical and Network Testers: IxLoad Attack, Ixia
  • Oscilloscopes: MDO4000 Mixed Domain Oscilloscope, Tektronix
  • PHY Test: PVA-3000 PhyView Analyzer, Sifos Technologies
  • RF/Microwave Test: URT-5000 Software Defined RF Player and Signal Generator, Averna
  • Semiconductor Test: T5773 NAND Flash Package Tester, Advantest
  • Signal Analyzers: PXIe-5665 VSA, National Instruments
  • Signal Sources: M8190A Arbitrary Waveform Generator, Agilent Technologies
  • Source-Measure Instruments: B2900A Series Precision Source/Measure Unit, Agilent Technologies

2012 Test Product of the Year award winner is the MDO4000 Mixed Domain Oscilloscope from Tektronix.

2012 Test of Time award winner is Spirent TestCenter from Spirent Communications.

2012 Test Engineer of the Year is Brad Davis of Broadcom.

For the full story please go to http://bit.ly/2012BIT